Riha, Zdenek

Faster Randomness Testing with the NIST Statistical Test Suite
Sys, Marek and Riha, Zdenek,
International Conference on Security, Privacy, and Applied Cryptography Engineering, 2014, 272–284.
BibTeX

@InProceedings{2014-space-sys,
  title = {Faster Randomness Testing with the NIST Statistical Test Suite},
  author = {Sys, Marek and Riha, Zdenek},
  booktitle = {International Conference on Security, Privacy, and Applied Cryptography Engineering},
  pages = {272--284},
  organization = {Springer},
  year = {2014},
}