• A Bad Day to Die Hard: Correcting the Dieharder Battery
    Marek Sys, Lubomir Obratil, Vashek Matyas and Dusan Klinec,
    Journal of Cryptology, Springer, 2022, 1–20.
    Keywords: dieharder battery, randomness, p-value, kolmogorov-smirnov test, DOI website, BibTeX 
    @Article{2022-journalofcryptology-sys,
  title = {A Bad Day to Die Hard: Correcting the Dieharder Battery},
  author = {Marek Sys and Lubomir Obratil and Vashek Matyas and Dusan Klinec},
  journal = {Journal of Cryptology},
  volume = {35},
  number = {1},
  pages = {1--20},
  publisher = {Springer},
  year = {2022},
  doi = {https://doi.org/10.1007/s00145-021-09414-y},
  keywords = {Dieharder battery, randomness, p-value, Kolmogorov-Smirnov test},
}