, Springer, 2022, 1–20.
@Article{2022-journalofcryptology-sys,
title = {A Bad Day to Die Hard: Correcting the Dieharder Battery},
author = {Marek Sys and Lubomir Obratil and Vashek Matyas and Dusan Klinec},
journal = {Journal of Cryptology},
volume = {35},
number = {1},
pages = {1--20},
publisher = {Springer},
year = {2022},
doi = {https://doi.org/10.1007/s00145-021-09414-y},
keywords = {Dieharder battery, randomness, p-value, Kolmogorov-Smirnov test},
}