* <text size="large">**A Bad Day to Die Hard: Correcting the Dieharder Battery**</text>\\ [[:publications:authors:marek-sys|Marek Sys]], [[:publications:authors:lubomir-obratil|Lubomir Obratil]], [[:publications:authors:vashek-matyas|Vashek Matyas]] and [[:publications:authors:dusan-klinec|Dusan Klinec]],\\ //Journal of Cryptology//, Springer, 2022, 1--20.\\ Keywords: [[:publications:keywords:dieharder-battery|dieharder battery]], [[:publications:keywords:randomness|randomness]], [[:publications:keywords:p-value|p-value]], [[:publications:keywords:kolmogorov-smirnov-test|kolmogorov-smirnov test]], [[http://dx.doi.org/https://doi.org/10.1007/s00145-021-09414-y|DOI website]], ++ BibTeX |<code>@Article{2022-journalofcryptology-sys,
  title = {A Bad Day to Die Hard: Correcting the Dieharder Battery},
  author = {Marek Sys and Lubomir Obratil and Vashek Matyas and Dusan Klinec},
  journal = {Journal of Cryptology},
  volume = {35},
  number = {1},
  pages = {1--20},
  publisher = {Springer},
  year = {2022},
  doi = {https://doi.org/10.1007/s00145-021-09414-y},
  keywords = {Dieharder battery, randomness, p-value, Kolmogorov-Smirnov test},
}
</code>++