* <text size="large">**Efficient On-Chip Randomness Testing Utilizing Machine Learning Techniques**</text>\\ [[:publications:authors:vojtech-mrazek|Vojtech Mrazek]], [[:publications:authors:marek-sys|Marek Sys]] and [[:publications:authors:petr-svenda|Petr Svenda]],\\ //IEEE Transactions on Very Large Scale Integration (VLSI) Systems//, IEEE, 2019.\\ Keywords: [[:publications:keywords:fpga|fpga]], [[:publications:keywords:genetic-algorithms|genetic-algorithms]], [[:publications:keywords:randomness|randomness]], [[:publications:keywords:distinguishers|distinguishers]], [[http://dx.doi.org/10.1109/TVLSI.2019.2923848|DOI website]], ++ BibTeX |<code>@InProceedings{2019-ieeevsli-mrazek,
  title = {Efficient On-Chip Randomness Testing Utilizing Machine Learning Techniques},
  author = {Vojtech Mrazek and Marek Sys and Petr Svenda},
  booktitle = {IEEE Transactions on Very Large Scale Integration (VLSI) Systems},
  publisher = {IEEE},
  year = {2019},
  issn = {1557-9999},
  doi = {10.1109/TVLSI.2019.2923848},
  keywords = {FPGA, genetic-algorithms, randomness, distinguishers},
}
</code>++